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      Defect generation and morphology of (001) Si surfaces during low-energy Ar-ion bombardment

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      Physical Review B
      American Physical Society (APS)

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          Activation energy for surface diffusion of Si on Si(001): A scanning-tunneling-microscopy study.

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            Binding and diffusion of a Si adatom on the Si(100) surface

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              Intensity oscillations of reflection high‐energy electron diffraction during silicon molecular beam epitaxial growth

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                Author and article information

                Journal
                PRBMDO
                Physical Review B
                Phys. Rev. B
                American Physical Society (APS)
                0163-1829
                1095-3795
                January 1992
                January 15 1992
                : 45
                : 3
                : 1507-1510
                Article
                10.1103/PhysRevB.45.1507
                bb5ecfb9-bae3-4f99-96f2-a2d23640928e
                © 1992

                http://link.aps.org/licenses/aps-default-license

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