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      • Record: found
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      Characterization of thin layers on perfect crystals with a multipurpose high resolution x-ray diffractometer

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      Journal: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
      Publisher: American Vacuum Society

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          Journal
          Journal ID (publisher-id): JVTBD9
          Title: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
          Abbreviated Title: J. Vac. Sci. Technol. B
          Publisher: American Vacuum Society
          ISSN (Print): 0734211X
          Publication date Created: 1983
          Publication date (Print): 1983
          Volume: 1
          Issue: 2
          Page: 338
          Article
          DOI: 10.1116/1.582553
          SO-VID: 21643a6a-5342-49a9-ac4b-7fa9f0d954b3
          Copyright © © 1983
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