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Intrinsic topological insulator Bi2Te3 thin films on Si and their thickness limit.
Author(s):
K He
,
Xing-Huan Wang
,
Gang Zhu
,
Yao Li
,
Shou Zhang
,
Li Li
,
Zhong Fang
,
Ying Liu
,
Liang Qi
,
Xi Chen
,
Lin Zhang
,
Pi-feng Jia
,
Guang-Chuan Wang
,
Xi Dai
,
Xin Xie
,
Cun-gen Ma
,
C-M Ye
,
Hao Liu
,
Qi-Kun Xue
Publication date:
2010-09-22
Journal:
Advanced Materials (Deerfield Beach, Fla.)
Keywords:
Bismuth
,
chemistry
,
Models, Molecular
,
Molecular Conformation
,
Semiconductors
,
Silicon
,
Surface Properties
,
Tellurium
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Author and article information
Journal
PubMed ID::
20648518
DOI::
10.1002/adma.201000368
ScienceOpen disciplines:
Chemistry
Keywords:
Bismuth
,
chemistry
,
Models, Molecular
,
Molecular Conformation
,
Semiconductors
,
Silicon
,
Surface Properties
,
Tellurium
Data availability:
ScienceOpen disciplines:
Chemistry
Keywords:
Bismuth
,
chemistry
,
Models, Molecular
,
Molecular Conformation
,
Semiconductors
,
Silicon
,
Surface Properties
,
Tellurium
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