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      Tunable sensitivity of zirconium oxynitride thin-film temperature sensor modulated by film thickness

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          Scherrer after sixty years: A survey and some new results in the determination of crystallite size

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            Low-dimensional systems: quantum size effects and electronic properties of semiconductor microcrystallites (zero-dimensional systems) and some quasi-two-dimensional systems

            A.D. Yoffe (1993)
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              Metrological characterization of X-ray diffraction methods at different acquisition geometries for determination of crystallite size in nano-scale materials

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                Author and article information

                Contributors
                Journal
                Journal of Materials Science: Materials in Electronics
                J Mater Sci: Mater Electron
                Springer Science and Business Media LLC
                0957-4522
                1573-482X
                September 2022
                August 27 2022
                September 2022
                : 33
                : 26
                : 20940-20952
                Article
                10.1007/s10854-022-08900-8
                f8686780-51f7-46a7-ab46-256d8edaad3e
                © 2022

                https://www.springer.com/tdm

                https://www.springer.com/tdm

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