For Publishers
DiscoveryMetadataPeer reviewHostingPublishing
For Researchers
JoinPublishReviewCollect
Register
Blog
About
Search
Advanced search
My ScienceOpen
Search
For Publishers
For Researchers
Blog
About
1
views
27
references
 Top references
cited by
3
    
0 reviews
 Review
0
comments
 Comment
0
recommends
+1 Recommend
0 collections
    0
    shares
      0
      similar
       All similar
      • Record: found
      • Abstract: found
      • Article: found
      Is Open Access

      3D grain reconstruction from laboratory diffraction contrast tomography

      research-article

      Read this article at

      ScienceOpenPublisherPMC
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Abstract

          A novel reconstruction method to retrieve grain structure from laboratory diffraction contrast tomography is presented and evaluated.

          Abstract

          A method for reconstructing the three-dimensional grain structure from data collected with a recently introduced laboratory-based X-ray diffraction contrast tomography system is presented. Diffraction contrast patterns are recorded in Laue-focusing geometry. The diffraction geometry exposes shape information within recorded diffraction spots. In order to yield the three-dimensional crystallographic microstructure, diffraction spots are extracted and fed into a reconstruction scheme. The scheme successively traverses and refines solution space until a reasonable reconstruction is reached. This unique reconstruction approach produces results efficiently and fast for well suited samples.

          Related collections

          Most cited references27

          • Record: found
          • Abstract: found
          • Article: not found

          Three-dimensional X-ray structural microscopy with submicrometre resolution.

          Wenge Yang, George Ice, David E. Larson … (2002)
          Advanced materials and processing techniques are based largely on the generation and control of non-homogeneous microstructures, such as precipitates and grain boundaries. X-ray tomography can provide three-dimensional density and chemical distributions of such structures with submicrometre resolution; structural methods exist that give submicrometre resolution in two dimensions; and techniques are available for obtaining grain-centroid positions and grain-average strains in three dimensions. But non-destructive point-to-point three-dimensional structural probes have not hitherto been available for investigations at the critical mesoscopic length scales (tenths to hundreds of micrometres). As a result, investigations of three-dimensional mesoscale phenomena--such as grain growth, deformation, crumpling and strain-gradient effects--rely increasingly on computation and modelling without direct experimental input. Here we describe a three-dimensional X-ray microscopy technique that uses polychromatic synchrotron X-ray microbeams to probe local crystal structure, orientation and strain tensors with submicrometre spatial resolution. We demonstrate the utility of this approach with micrometre-resolution three-dimensional measurements of grain orientations and sizes in polycrystalline aluminium, and with micrometre depth-resolved measurements of elastic strain tensors in cylindrically bent silicon. This technique is applicable to single-crystal, polycrystalline, composite and functionally graded materials.
          Article 0 comments Cited 144 times – based on 0 reviews     Review now
            Bookmark
            • Record: found
            • Abstract: found
            • Article: not found

            Probing the structure of heterogeneous diluted materials by diffraction tomography.

            Jean Susini, Pierre Bleuet, Philippe Walter … (2008)
            The advent of nanosciences calls for the development of local structural probes, in particular to characterize ill-ordered or heterogeneous materials. Furthermore, because materials properties are often related to their heterogeneity and the hierarchical arrangement of their structure, different structural probes covering a wide range of scales are required. X-ray diffraction is one of the prime structural methods but suffers from a relatively poor detection limit, whereas transmission electron analysis involves destructive sample preparation. Here we show the potential of coupling pencil-beam tomography with X-ray diffraction to examine unidentified phases in nanomaterials and polycrystalline materials. The demonstration is carried out on a high-pressure pellet containing several carbon phases and on a heterogeneous powder containing chalcedony and iron pigments. The present method enables a non-invasive structural refinement with a weight sensitivity of one part per thousand. It enables the extraction of the scattering patterns of amorphous and crystalline compounds with similar atomic densities and compositions. Furthermore, such a diffraction-tomography experiment can be carried out simultaneously with X-ray fluorescence, Compton and absorption tomographies, enabling a multimodal analysis of prime importance in materials science, chemistry, geology, environmental science, medical science, palaeontology and cultural heritage.
            Article 0 comments Cited 64 times – based on 0 reviews     Review now
              Bookmark
              • Record: found
              • Abstract: found
              • Article: not found

              Three-dimensional maps of grain boundaries and the stress state of individual grains in polycrystals and powders

              H. F. Poulsen, S Nielsen, E. M. Lauridsen … (2001)
              A fast and non-destructive method for generating three-dimensional maps of the grain boundaries in undeformed polycrystals is presented. The method relies on tracking of micro-focused high-energy X-rays. It is verified by comparing an electron microscopy map of the orientations on the 2.5 × 2.5 mm surface of an aluminium polycrystal with tracking data produced at the 3DXRD microscope at the European Synchrotron Radiation Facility. The average difference in grain boundary position between the two techniques is 26 µm, comparable with the spatial resolution of the 3DXRD microscope. As another extension of the tracking concept, algorithms for determining the stress state of the individual grains are derived. As a case study, 3DXRD results are presented for the tensile deformation of a copper specimen. The strain tensor for one embedded grain is determined as a function of load. The accuracy on the strain is Δ∊ ≃ 10−4.
              Article 0 comments Cited 62 times – based on 0 reviews     Review now
                Bookmark
                All references

                Author and article information

                Journal
                Journal ID (nlm-ta): J Appl Crystallogr
                Journal ID (iso-abbrev): J Appl Crystallogr
                Journal ID (publisher-id): J. Appl. Cryst.
                Title: Journal of Applied Crystallography
                Publisher: International Union of Crystallography
                ISSN (Print): 0021-8898
                ISSN (Electronic): 1600-5767
                Publication date Collection: 01 June 2019
                Publication date (Electronic): 31 May 2019
                Publication date PMC-release: 31 May 2019
                Volume: 52
                Issue: Pt 3 ( publisher-idID: j190300 )
                Pages: 643-651
                Affiliations
                [a ]Xnovo Technology ApS, Theilgaards Alle 9, 1th., Køoge, 4600, Denmark
                [b ]Carl Zeiss X-ray Microscopy, 4385 Hopyard Road, Pleasanton, CA 94588, USA
                Author notes
                Correspondence e-mail: fbachmann@ 123456xnovotech.com
                Article
                Publisher ID: nb5238 Coden ID: JACGAR Publisher Item ID: S1600576719005442
                DOI: 10.1107/S1600576719005442
                PMC ID: 6557177
                SO-VID: d8d13878-6da5-485b-888b-b14905897a6e
                Copyright © © Florian Bachmann et al. 2019
                License:

                This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.

                History
                Date received : 20 December 2018
                Date accepted : 21 April 2019
                Page count
                Pages: 9
                Categories
                Subject: Research Papers

                ScienceOpen disciplines: Analytical chemistry
                Keywords: three-dimensional x-ray diffraction (3dxrd),grain mapping,dct,x-ray diffraction contrast microscopy,reconstruction schemes
                Data availability:
                ScienceOpen disciplines: Analytical chemistry
                Keywords: three-dimensional x-ray diffraction (3dxrd), grain mapping, dct, x-ray diffraction contrast microscopy, reconstruction schemes

                Comments

                Comment on this article