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      Defect energy levels in HfO2 high-dielectric-constant gate oxide

      Author(s): , , ,
      Publication date Created:
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      Journal: Applied Physics Letters
      Publisher: AIP Publishing

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          Band offsets of wide-band-gap oxides and implications for future electronic devices

          John Robertson (2000)
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            Generalized Kohn-Sham schemes and the band-gap problem

            A. Seidl, A. Görling, P. Vogl … (1996)
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              Electronic structure, properties, and phase stability of inorganic crystals: A pseudopotential plane-wave study

              B. Winkler, V. Milman, J. A. White … (2000)
              Article 0 comments Cited 185 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Applied Physics Letters
                Abbreviated Title: Appl. Phys. Lett.
                Publisher: AIP Publishing
                ISSN (Print): 0003-6951
                ISSN (Electronic): 1077-3118
                Publication date Created: October 31 2005
                Publication date (Print): October 31 2005
                Volume: 87
                Issue: 18
                Page: 183505
                Article
                DOI: 10.1063/1.2119425
                SO-VID: c8383cbc-391f-428d-b94f-32da3e098581
                Copyright © © 2005
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