Defects in Irradiated Silicon: Electron Paramagnetic Resonance of the Divacancy

Watkins, G. D.; Corbett, J. W.

doi:10.1103/PhysRev.138.A543

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Defects in Irradiated Silicon: Electron Paramagnetic Resonance of the Divacancy

Author(s): G. D. Watkins , J. W. Corbett

Publication date (Print): April 1965

Journal: Physical Review

Publisher: American Physical Society (APS)

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Journal ID (publisher-id): PHRVAO

Title: Physical Review

Abbreviated Title: Phys. Rev.

Publisher: American Physical Society (APS)

ISSN (Print): 0031-899X

Publication date Created: April 1965

Publication date (Print): April 1965

Volume: 138

Issue: 2A

Pages: A543-A555

Article

DOI: 10.1103/PhysRev.138.A543

SO-VID: c6a65fef-d586-4d0b-9a66-82e12a9bfa10

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http://link.aps.org/licenses/aps-default-license

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Electron Channelling Contrast Imaging (ECCI)

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