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      The mechanism of the enhancement of divacancy production by oxygen during electron irradiation of silicon. II. Computer modeling

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      Journal of Applied Physics
      AIP Publishing

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          Defects in Irradiated Silicon. II. Infrared Absorption of the Si-\(A\)Center

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            EPR Observation of the Isolated Interstitial Carbon Atom in Silicon

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              Production of Divacancies and Vacancies by Electron Irradiation of Silicon

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                January 1983
                January 1983
                : 54
                : 1
                : 179-183
                Article
                10.1063/1.331728
                09e61e16-266e-44d0-8c96-e869cbd601dd
                © 1983
                History

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