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Scanning Electron Microscopy and X-Ray Microanalysis
other
Author(s):
Joseph I. Goldstein
,
Dale E. Newbury
,
Patrick Echlin
,
David C. Joy
,
Charles Fiori
,
Eric Lifshin
Publication date
(Print):
1981
Publisher:
Springer US
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Book
ISBN (Print):
978-1-4613-3275-6
ISBN (Electronic):
978-1-4613-3273-2
Publication date (Print):
1981
DOI:
10.1007/978-1-4613-3273-2
SO-VID:
aabdac9f-5c3d-4645-b31c-66969b57c174
License:
http://www.springer.com/tdm
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Book chapters
pp. 1
Introduction
pp. 19
Electron Optics
pp. 53
Electron-Beam-Specimen Interactions
pp. 123
Image Formation in the Scanning Electron Microscope
pp. 205
X-Ray Spectral Measurement: WDS and EDS
pp. 275
Qualitative X-Ray Analysis
pp. 305
Quantitative X-Ray Microanalysis
pp. 393
Practical Techniques of X-Ray Analysis
pp. 447
Materials Specimen Preparation for SEM and X-Ray Microanalysis
pp. 461
Coating Techniques for SEM and Microanalysis
pp. 495
Preparation of Biological Samples for Scanning Electron Microscopy
pp. 541
Preparation of Biological Samples for X-Ray Microanalysis
pp. 589
Application of the SEM and EPMA to Solid Samples and Biological Materials
pp. 615
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