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      Measurement of Roughness of Two Interfaces of a Dielectric Film by Scattering Ellipsometry

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      Publication date (Electronic):
      Journal: Physical Review Letters
      Publisher: American Physical Society (APS)

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          Reflection of electromagnetic waves from slightly rough surfaces

          Stephen Rice (1951)
          Article 0 comments Cited 199 times – based on 0 reviews     Review now
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            Thin liquid films on rough or heterogeneous solids

            Mark Robbins, Jean-François Joanny, David Andelman (1991)
            Article 0 comments Cited 54 times – based on 0 reviews     Review now
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              Scattering of light by slightly rough surfaces or thin films including plasma resonance emission

              E. Kr�ger, E Kretschmann (1970)
              Article 0 comments Cited 48 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Journal ID (publisher-id): PRLTAO
                Title: Physical Review Letters
                Abbreviated Title: Phys. Rev. Lett.
                Publisher: American Physical Society (APS)
                ISSN (Print): 0031-9007
                ISSN (Electronic): 1079-7114
                Publication date Created: July 2000
                Publication date (Electronic): July 10 2000
                Volume: 85
                Issue: 2
                Pages: 349-352
                Article
                DOI: 10.1103/PhysRevLett.85.349
                SO-VID: 91d363fc-2435-4f65-9b99-09a25681b29d
                Copyright © © 2000
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                http://link.aps.org/licenses/aps-default-license

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