Ex situellipsometric investigation of nanocolumns inclination angle of obliquely evaporated silicon thin films

Beydaghyan, Gisia; Buzea, Cristina; Cui, Yan Ge; Elliott, Chelsea; Robbie, Kevin

doi:10.1063/1.2084329

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Ex situellipsometric investigation of nanocolumns inclination angle of obliquely evaporated silicon thin films

Author(s): Gisia Beydaghyan , Cristina Buzea , Yan Cui , Chelsea Elliott , Kevin Robbie

Publication date Created: October 10 2005

Publication date (Print): October 10 2005

Journal: Applied Physics Letters

Publisher: AIP Publishing

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Most cited references 15

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Oblique evaporation and surface diffusion

Cock Lodder, Leon Abelmann (1997)

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Ultrahigh vacuum glancing angle deposition system for thin films with controlled three-dimensional nanoscale structure

Kevin Robbie, Gisia Beydaghyan, Tim Brown … (2004)

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Effective medium theory and angular dispersion of optical constants in films with oblique columnar structure

G.B. Smith (1989)

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Journal

Title: Applied Physics Letters

Abbreviated Title: Appl. Phys. Lett.

Publisher: AIP Publishing

ISSN (Print): 0003-6951

ISSN (Electronic): 1077-3118

Publication date Created: October 10 2005

Publication date (Print): October 10 2005

Volume: 87

Issue: 15

Page: 153103

Article

DOI: 10.1063/1.2084329

SO-VID: b8febc49-6bb3-4775-8fc4-c57c506901ce

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Ex situellipsometric investigation of nanocolumns inclination angle of obliquely evaporated silicon thin films

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Silicon thin film solar cells

Most cited references 15

Oblique evaporation and surface diffusion

Ultrahigh vacuum glancing angle deposition system for thin films with controlled three-dimensional nanoscale structure

Effective medium theory and angular dispersion of optical constants in films with oblique columnar structure

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