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Quantum metrology
Preprint
2005-09-26
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Abstract
We point out a general framework that encompasses most cases in which quantum effects
enable an increase in precision when estimating a parameter (quantum metrology). The
typical quantum precision-enhancement is of the order of the square root of the number
of times the system is sampled. We prove that this is optimal and we point out the
different strategies (classical and quantum) that permit to attain this bound.