0
views
0
recommends
+1 Recommend
0 collections
    0
    shares
      • Record: found
      • Abstract: found
      • Article: found
      Is Open Access

      Nano-gap electrode dielectrophoresis for tether-free trapping and interferometric-scattering detection of single 20 nm particles

      Preprint

      Read this article at

      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Abstract

          Accurate detection and characterization of nanoparticles within confined spaces is crucial for applications ranging from nanofluidics to biotechnology. We present a novel approach that combines interferometric scattering (iSCAT) detection with trapping by dielectrophoresis (DEP) to achieve label-free detection of nanoparticles that are trapped and/or actuated between nano-gap electrodes. DEP utilizes the interaction between the induced dipole of the particle and the applied electric field to create a trapping potential. We demonstrate our method by trapping and label-free detection of down to 20 nm polystyrene nanoparticles. Additionally, we demonstrate that the signal-to-noise ratio of our detection can be boosted up to 20-fold by periodic actuation of the nanoparticle in the trap. This is done by a digital lock-in detection scheme on the modulated scattering signal. Our method holds promise for various applications, including assembly of nanoparticles, single-particle property analysis, and nanofluidic devices.

          Related collections

          Author and article information

          Journal
          20 May 2024
          Article
          2405.12338
          3aa0b54b-e722-4a8e-99fa-2071d75630ce

          http://creativecommons.org/licenses/by-nc-nd/4.0/

          History
          Custom metadata
          physics.optics physics.chem-ph

          Physical chemistry,Optical materials & Optics
          Physical chemistry, Optical materials & Optics

          Comments

          Comment on this article