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      Vision-Language Models for Vision Tasks: A Survey

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              ImageNet classification with deep convolutional neural networks

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                Author and article information

                Contributors
                Journal
                IEEE Transactions on Pattern Analysis and Machine Intelligence
                IEEE Trans. Pattern Anal. Mach. Intell.
                Institute of Electrical and Electronics Engineers (IEEE)
                0162-8828
                2160-9292
                1939-3539
                August 2024
                August 2024
                : 46
                : 8
                : 5625-5644
                Affiliations
                [1 ]School of Computer Science and Engineering, Nanyang Technological University, Singapore
                Article
                10.1109/TPAMI.2024.3369699
                33f63b3f-3c3f-44b2-a0b8-c801b4ff7f10
                © 2024

                https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html

                https://doi.org/10.15223/policy-029

                https://doi.org/10.15223/policy-037

                History

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