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      Crystallite coalescence: A mechanism for intrinsic tensile stresses in thin films

      Author(s): ,
      Publication date (Print):
      Journal: Journal of Materials Research
      Publisher: Cambridge University Press (CUP)

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          Stresses and deformation processes in thin films on substrates

          Mary Doerner, William D. Nix (1988)
          Article 0 comments Cited 103 times – based on 0 reviews     Review now
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            Intrinsic stress in sputter-deposited thin films

            Henry Windischmann (1992)
            Article 0 comments Cited 89 times – based on 0 reviews     Review now
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              Stresses in thin films: The relevance of grain boundaries and impurities

              R.W. Hoffman (1976)
              Article 0 comments Cited 85 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Journal ID (publisher-id): applab
                Title: Journal of Materials Research
                Abbreviated Title: J. Mater. Res.
                Publisher: Cambridge University Press (CUP)
                ISSN (Print): 0884-2914
                ISSN (Electronic): 2044-5326
                Publication date Created: August 1999
                Publication date (Print): January 2011
                Volume: 14
                Issue: 08
                Pages: 3467-3473
                Article
                DOI: 10.1557/JMR.1999.0468
                SO-VID: 0d7ef550-717e-4dfa-9b36-840d42eaab6f
                Copyright © © 1999
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