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      Measurement of Thin Film Mechanical Properties Using Nanoindentation

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      MRS Bulletin
      Cambridge University Press (CUP)

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          Abstract

          One of the simplest ways to measure the mechanical properties of a thin film is to deform it on a very small scale. Because indentation testing with a sharp indenter is one convenient means to accomplish this, nanoindentation, or indentation testing at the nanometer scale, has become one of the most widely used techniques for measuring the mechanical properties of thin films. Other reasons for the popularity of nanoindentation stem from the ease with which a wide variety of mechanical properties can be measured without removing the film from its substrate and the ability to probe a surface at numerous points and spatially map its mechanical properties. The utility of the mapping capability is illustrated in Figure 1, which shows several small indentations made at selected points in a microelectronic device. The hardness and modulus of the device were determined at each point. In addition to microelectronics, nanoindentation has also proved useful in the study of optical coatings, hard coatings, and materials with surfaces modified by ion implantation and laser treatment.

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          Most cited references1

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          Progress in the Development of a Mechanical Properties Microprobe

          W Oliver (1986)
          A mechanical properties microprobe is an exciting concept. A system with the ability to evaluate the mechanical response of a sample with submicron spacial resolution would have an extremely wide range of applications. Recent developments in hardware and understanding have placed this goal within our grasp.
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            Author and article information

            Journal
            applab
            MRS Bulletin
            MRS Bull.
            Cambridge University Press (CUP)
            0883-7694
            1938-1425
            July 1992
            November 2013
            : 17
            : 07
            : 28-33
            Article
            10.1557/S0883769400041634
            08947bad-b2fb-48b2-9faf-4cd1e454dc02
            © 1992
            History

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