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Polarized off-axis Raman spectroscopy: A technique for measuring stress tensors in semiconductors
December 1999
December 1999
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Stress-Induced Shifts of First-Order Raman Frequencies of Diamond- and Zinc-Blende-Type Semiconductors
C. J. Buchenauer, F. Cerdeira, Manuel Cardona … (1972)
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Effect of static uniaxial stress on the Raman spectrum of silicon
M. Cardona, F.H. Pollak, E. Burstein … (1970)