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      Transición electrónica fundamental en pozos cuánticos GaN/InGaN/GaN con estructura de zincblenda

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          Abstract

          En este trabajo calculamos la energía de transición entre el primer nivel de huecos y el primer nivel de electrones (1h-1e) en pozos cuánticos de GaN/In xGa1-xN/GaN con estructura cúbica. Los cálculos los realizamos mediante la aproximación empírica de amarre fuerte (tight binding) con una base de orbitales atómicos sp³s*, interacción a primeros vecinos e incorporando el acoplamiento espín-órbita, en conjunto con el método de empalme de las funciones de Green de superficie. Los parámetros de amarre fuerte de la aleación los obtuvimos a partir de los parámetros de los compuestos binarios GaN e InN, utilizando la aproximación del cristal virtual. Analizamos el comportamiento de la energía de transición como función del ancho del pozo para x=0.1 y x=0.2, usando varios valores del band offset. La tensión en el pozo la tomamos en cuenta escalando los parámetros de amarre fuerte considerando dos conjuntos de valores para la ley de escalamiento.

          Translated abstract

          In this work we calculate the transition energy from the first level of holes to the first level of electrons (1h-1e) for cubic GaN/In xGa1-xN/GaN quantum wells. We employ the empirical tight binding approach with an sp³s* orbital basis, nearest neighbors interactions and the spin-orbit coupling, together with the surface Green function matching method. We obtain the tight binding parameters of the alloy from those of the binary compounds GaN and InN using the virtual crystal approximation. We study the transition energy behavior varying the well width for x=0.1 and x=0.2, using several values for the band offset and for two sets of exponent values used in the tight-binding parameters scaling rule when we take into account the strain in the well.

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          Photo-induced charge transfer across the interface between organic molecular crystals and polymers

          Photo-induced charge transfer of positive and negative charges across the interface between an ordered organic semiconductor and a polymeric insulator is observed in the field-effect experiments. Immobilization of the transferred charge in the polymer results in a shift of the field-effect threshold of polaronic conduction along the interface in the semiconductor, which allows for direct measurements of the charge transfer rate. The transfer occurs when the photon energy exceeds the absorption edge of the semiconductor. The direction of the transverse electric field at the interface determines the sign of the transferred charge; the transfer rate is controlled by the field magnitude and light intensity.
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            Nitride Semiconductors and Devices

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              Phys. Rev.

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                Author and article information

                Contributors
                Role: ND
                Role: ND
                Role: ND
                Role: ND
                Journal
                sv
                Superficies y vacío
                Superf. vacío
                Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
                1665-3521
                2006
                : 19
                : 3
                : 12-15
                Affiliations
                [1 ] Benemérita Universidad Autónoma de Puebla México
                [2 ] Universidad Autónoma de Zacatecas México
                [3 ] Benemérita Universidad Autónoma de Puebla México
                Article
                S1665-35212006000300002
                f43c50cc-df2e-4a04-891a-b3a69e2c971a

                http://creativecommons.org/licenses/by/4.0/

                History
                Categories
                Materials Science, Multidisciplinary

                General materials science
                Quantum wells,Electronic states,Alloys,Pozos cuánticos,Estados electrónicos,Aleaciones

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