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      Incorporation of implanted In and Sb in silicon during amorphous layer regrowth

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      Journal of Applied Physics
      AIP Publishing

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          Reordering of amorphous layers of Si implanted with31P,75As, and11B ions

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            Influence of16O,12C,14N, and noble gases on the crystallization of amorphous Si layers

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              Chaneling effect measurements of the recrystallization of amorphous Si layers on crystal Si

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                January 1979
                January 1979
                : 50
                : 1
                : 173-182
                Article
                10.1063/1.325686
                e8553b99-f12e-4459-965d-efd315187635
                © 1979
                History

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