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      Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation

      Author(s): , , ,
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      Journal: Review of Scientific Instruments
      Publisher: AIP Publishing

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          External optical feedback effects on semiconductor injection laser properties

          Peter Lang, K Kobayashi (1980)
          Article 0 comments Cited 429 times – based on 0 reviews     Review now
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            Novel optical approach to atomic force microscopy

            Gerhard Meyer, Nabil Amer (1988)
            Article 0 comments Cited 268 times – based on 0 reviews     Review now
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              Measuring adhesion, attraction, and repulsion between surfaces in liquids with an atomic-force microscope.

              Weisenhorn, Maivald, Butt … (1992)
              Article 0 comments Cited 60 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Review of Scientific Instruments
                Abbreviated Title: Review of Scientific Instruments
                Publisher: AIP Publishing
                ISSN (Print): 0034-6748
                ISSN (Electronic): 1089-7623
                Publication date Created: March 2004
                Publication date (Print): March 2004
                Volume: 75
                Issue: 3
                Pages: 689-693
                Article
                DOI: 10.1063/1.1646767
                SO-VID: e682b7f6-edea-4468-be59-b2c23fbd19c1
                Copyright © © 2004
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