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      Can new uses for phaser data measurements prevent blackouts? [advertisement]

      Publication date (Print):
      Journal: IEEE Design & Test of Computers
      Publisher: Institute of Electrical and Electronics Engineers (IEEE)

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          Journal
          Title: IEEE Design & Test of Computers
          Abbreviated Title: IEEE Des. Test. Comput.
          Publisher: Institute of Electrical and Electronics Engineers (IEEE)
          ISSN (Print): 0740-7475
          Publication date Created: December 2012
          Publication date (Print): December 2012
          Volume: 29
          Issue: 6
          Page: 107
          Article
          DOI: 10.1109/MDT.2013.2238057
          SO-VID: e08f3de5-bc5a-4f4f-8de5-85eb19ed6791
          Copyright © © 2012
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