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Over-determined offset short calibration of a VNA
proceedings-article
Author(s):
Johannes Paul Hoffmann
,
Pascal Leuchtmann
,
Rudiger Vahldieck
Publication date
(Print):
June 2008
Conference name:
2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008
Conference date:
July 15, 2008 - July 20, 2008
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Trace Elements and Electrolytes
Author and article information
Conference
Publication date:
June 2008
Publication date (Print):
June 2008
Pages
: 47-50
Article
DOI:
10.1109/MWSYM.2008.4633325
SO-VID:
df9ef194-b147-41e2-b5fd-7195c6b1af9b
Copyright ©
© 2008
Conference name:
2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008
Conference location:
Atlanta, GA, USA
Conference date:
July 15, 2008 - July 20, 2008
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