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      $\varepsilon$-Optimal Non-Bayesian Anomaly Detection for Parametric Tomography

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          Journal
          Title: IEEE Transactions on Image Processing
          Abbreviated Title: IEEE Trans. on Image Process.
          Publisher: Institute of Electrical and Electronics Engineers (IEEE)
          ISSN (Print): 1057-7149
          ISSN (Electronic): 1941-0042
          Publication date Created: November 2008
          Publication date (Print): November 2008
          Volume: 17
          Issue: 11
          Pages: 1985-1999
          Article
          DOI: 10.1109/TIP.2008.2004431
          SO-VID: df494f41-6031-4220-a340-2d311fb9d5f6
          Copyright © © 2008
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