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      Solar cell surface defect inspection based on multispectral convolutional neural network

      Author(s): , , ,
      Publication date (Electronic):
      Journal: Journal of Intelligent Manufacturing
      Publisher: Springer Nature

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          A blind source separation technique using second-order statistics

          A. Belouchrani, K. Abed-Meraim, J. Cardoso … (1997)
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            NB-CNN: Deep Learning-Based Crack Detection Using Convolutional Neural Network and Naïve Bayes Data Fusion

            Fu-Chen Chen, Mohammad R Jahanshahi (2018)
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              Design of deep convolutional neural network architectures for automated feature extraction in industrial inspection

              Moshe Shpitalni, Daniel R. Weimer, Bernd Scholz-Reiter (2016)
              Article 0 comments Cited 81 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Journal of Intelligent Manufacturing
                Abbreviated Title: J Intell Manuf
                Publisher: Springer Nature
                ISSN (Print): 0956-5515
                ISSN (Electronic): 1572-8145
                Publication date (Electronic): December 14 2018
                Article
                DOI: 10.1007/s10845-018-1458-z
                SO-VID: c2f8a9dd-673b-4926-b03d-80f2e14e51c1
                Copyright © © 2018
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                http://www.springer.com/tdm

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