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      Gate Fringe-Induced Barrier Lowering in Underlap FinFET Structures and Its Optimization

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          Extension and source/drain design for high-performance finFET devices

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            Sub-50 nm P-channel FinFET

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              Self-aligned (top and bottom) double-gate MOSFET with a 25 nm thick silicon channel

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                Author and article information

                Journal
                IEEE Electron Device Letters
                IEEE Electron Device Lett.
                Institute of Electrical and Electronics Engineers (IEEE)
                0741-3106
                1558-0563
                January 2008
                January 2008
                : 29
                : 1
                : 128-130
                Article
                10.1109/LED.2007.911974
                c20bfe11-878e-42aa-9006-bdd065b86ae0
                © 2008
                History

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