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      F-doping-Enhanced Carrier Transport in the SnO2/Perovskite Interface for High-Performance Perovskite Solar Cells.

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          Abstract

          SnO2 is widely used as the electron transport layer (ETL) in n-i-p perovskite solar cells. However, the deep-level defects at the interface between SnO2 and the perovskite film will lead to energy loss, reducing the open-circuit voltage. Therefore, the interface optimization is essential to raise the efficiency and enhance the stability of perovskite solar cells. In this work, we introduce NH4F into the SnO2 electron transport layers, and the optimized SnO2 films reduce the interface defect density, improve the charge extraction, and reveal a better energy-level arrangement. Compared to the conventional SnO2 perovskite solar cell, the average Voc is improved by 70 mV with the champion efficiency up to 22.12%. Moreover, the unencapsulated F-doped SnO2 perovskite solar cells show better thermal stability (maintained 86.2%) and humidity stability (maintained 80.8%) after 35 days.

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          Author and article information

          Journal
          ACS Appl Mater Interfaces
          ACS applied materials & interfaces
          American Chemical Society (ACS)
          1944-8252
          1944-8244
          Sep 21 2022
          : 14
          : 37
          Affiliations
          [1 ] State Key Laboratory of Material Processing and Die & Mold Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology (HUST), Wuhan 430074, China.
          [2 ] Shenzhen R&D Center of Huazhong University of Science and Technology, Shenzhen 518000, China.
          [3 ] Institute for Quantum Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
          Article
          10.1021/acsami.2c11390
          36093928
          bed2164b-1587-41e7-ab32-ae5faf2eafca
          History

          stability,tin oxide,F-doping,interfacial passivation,open-circuit voltage,perovskite solar cells

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