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      Liquid‐Assisted Laser Nanotexturing of Silicon: Onset of Hydrodynamic Processes Regulated by Laser‐Induced Periodic Surface Structures

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          Abstract

          Upon systematic studies of femtosecond‐laser processing of monocrystalline Si in oxidation‐preventing methanol, it is shown that the electromagnetic processes dominating at initial steps of the progressive morphology evolution define the onset of the hydrodynamic processes and morphology upon subsequent multi‐pulse exposure. Under promoted exposure quasi‐regular subwavelength laser‐induced periodic surface structures (LIPSSs) are justified to evolve through the template‐assisted development of the Rayleigh‐Plateau hydrodynamic instability in the molten ridges forming quasi‐regular patterns with a supra‐wavelength periodicity and preferential alignment along polarization direction of the incident light. Subsequent exposure promotes fusion‐assisted morphology rearrangement resulting in a spiky surface with random orientation, yet constant inter‐structure distance correlated with initial LIPSS periodicity. Along with the insight onto the physical picture driving the morphology evolution and supra‐wavelength nanostructure formation, this experiments also demonstrated that resulting quasi‐regular and random spiky morphology can be tailored by the intensity/polarization distribution of incident laser beam allowing on‐demand surface nanotexturing with diverse hierarchical surface morphologies exhibiting reduced reflectivity at visible and shortwave‐IR wavelengths. Finally, the practical attractiveness of the suggested approach for improving near‐IR photoresponse and expanding operation spectral range of vertical p‐n junction Si photodetector operating under room temperature and zero‐bias conditions via single‐step annealing‐free nanopatterning is highlighted.

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          Most cited references72

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          Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV

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            Imaging-based molecular barcoding with pixelated dielectric metasurfaces

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              Simple technique for measurements of pulsed Gaussian-beam spot sizes.

              J. Liu (1982)
              A simple technique for in situ measurements of pulsed Gaussian-beam spot sizes is reported. This technique is particularly useful for measurements on highly focused beam spots. It can also be used for absolute calibration of the threshold-energy fluences for pulsed-laser-induced effects. The thresholds for several effects in picosecondlaser-induced phase transformation on silicon-crystal surfaces are calibrated with this technique.
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                Author and article information

                Contributors
                (View ORCID Profile)
                Journal
                Advanced Materials Technologies
                Adv Materials Technologies
                Wiley
                2365-709X
                2365-709X
                April 2024
                March 08 2024
                April 2024
                : 9
                : 8
                Affiliations
                [1 ] Institute of Automation and Control Processes, Far Eastern Branch Russian Academy of Science 5 Radio Str. Vladivostok 690041 Russia
                [2 ] Far Eastern Federal University Vladivostok 690922 Russia
                [3 ] Image Processing Systems Institute of RAS ‐ Branch of the FSRC “Crystallography and Photonics” RAS Samara 443001 Russia
                [4 ] CIC NanoGUNE BRTA Avda Tolosa 76 Donostia‐San Sebastian 20018 Spain
                [5 ] Laser Center (LFM) University of Applied Sciences Munster Stegerwaldstraße 39 48565 Steinfurt Germany
                [6 ] Center for Lasers and Optics Anhui University Hefei 230088 China
                [7 ] Qingdao Innovation and Development Center Harbin Engineering University Qingdao Shandong 266000 China
                Article
                10.1002/admt.202301567
                b5da56cf-5393-4d79-98d9-462c0329ef09
                © 2024

                http://onlinelibrary.wiley.com/termsAndConditions#vor

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