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Breakthrough Short Circuit Robustness Demonstrated in Vertical GaN Fin JFET
Author(s):
Ruizhe Zhang
,
Jingcun Liu
,
Qiang Li
,
Subhash Pidaparthi
,
Andrew Edwards
,
Cliff Drowley
,
Yuhao Zhang
,
Andrew Edwards
,
Andrew Edwards
,
Andrew Edwards
,
Andrew Edwards
,
Andrew Edwards
,
Andrew Edwards
Publication date:
2022
Journal:
IEEE Transactions on Power Electronics
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Trace Elements and Electrolytes
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DOI::
10.1109/TPEL.2021.3138451
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