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      Core-shell structured hyperbranched aromatic polyamide/BaTiO3 hybrid filler for poly(vinylidene fluoride-trifluoroethylene-chlorofluoroethylene) nanocomposites with the dielectric constant comparable to that of percolative composites.

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          Abstract

          Polymer nanocomposites with the dielectric constant comparable to that of percolative composites are successfully prepared by using core-shell structured hyperbranched aromatic polyamide grafted barium titanate (BT-HBP) hybrid nanofiller. Poly(vinylidene fluoride-trifluoroethylene-chlorofluoroethylene) (PVDF-TrFE-CFE) was used as the polymer matrix because of its high intrinsic dielectric constant and easy processability. The BT-HBP hybrid nanofiller were prepared by a solution polymerization of diaminobenzoic acid on the surface of amino-funcationalized BT nanoparticles. Nuclear magnetic resonance ((1)H NMR) and transmission electron microscopy (TEM) were used to verify the chemical structure of the hyperbranched aromatic polyamide and core-shell structure of the hybrid filler, respectively. It was found that the nanocomposite with 40 vol % BaTiO3-HBP had a dielectric constant of 1485.5 at 1000 Hz, whereas the corresponding nanocomposite sample with untreated BaTiO3 only showed a dielectric constant of 206.3. Compared with classic percolative composites, the advantage of the PVDF-TrFE-CFE/BaTiO3-HBP nanocomposites is that the composites show high enough breakdown strength and high dielectric constant simultaneously. An enhanced interfacial polarization mechanism between the BT-HBP and the polymer matrix was suggested for understanding the observed unusually high dielectric constant.

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          Author and article information

          Journal
          ACS Appl Mater Interfaces
          ACS applied materials & interfaces
          American Chemical Society (ACS)
          1944-8252
          1944-8244
          Mar 13 2013
          : 5
          : 5
          Affiliations
          [1 ] Department of Polymer Science and Engineering and Shanghai Key Laboratory of Electrical Insulation and Thermal Aging, Shanghai Jiao Tong University, Shanghai 200240, People's Republic of China.
          Article
          10.1021/am302959n
          23380893
          9b3f8f0d-2296-421f-b7b6-62b5be464793
          History

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