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      Effect of Temperature on the Aging rate of Li Ion Battery Operating above Room Temperature

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      1 , 2 , 5 , a , 2 , 3 , 4
      Scientific Reports
      Nature Publishing Group

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          Abstract

          Temperature is known to have a significant impact on the performance, safety, and cycle lifetime of lithium-ion batteries (LiB). However, the comprehensive effects of temperature on the cyclic aging rate of LiB have yet to be found. We use an electrochemistry-based model (ECBE) here to measure the effects on the aging behavior of cycled LiB operating within the temperature range of 25 °C to 55 °C. The increasing degradation rate of the maximum charge storage of LiB during cycling at elevated temperature is found to relate mainly to the degradations at the electrodes, and that the degradation of LCO cathode is larger than graphite anode at elevated temperature. In particular, the formation and modification of the surface films on the electrodes as well as structural/phase changes of the LCO electrode, as reported in the literatures, are found to be the main contributors to the increasing degradation rate of the maximum charge storage of LiB with temperature for the specific operating temperature range. Larger increases in the Warburg elements and cell impedance are also found with cycling at higher temperature, but they do not seriously affect the state of health (SoH) of LiB as shown in this work.

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          Ageing mechanisms in lithium-ion batteries

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            The Levenberg-Marquardt algorithm: Implementation and theory

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              A review of conduction phenomena in Li-ion batteries

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                Author and article information

                Journal
                Sci Rep
                Sci Rep
                Scientific Reports
                Nature Publishing Group
                2045-2322
                06 August 2015
                2015
                : 5
                : 12967
                Affiliations
                [1 ]Nanyang Technological University, School of Electrical Electronics Engineering , Blk S2.1, 50 Nanyang Avenue, Singapore 639798, Singapore
                [2 ]TUM CREATE PTE LTD , 1 Create Way, #10-02 Create Tower, Singapore 138602, Singapore
                [3 ]Chang Gung University, Department of Electronics Engineering, Taoyuan , TaiWan 259 Wen-Hwa 1st Road, Kwei-Shan Tao-Yuan, Taiwan, 333, R.O.C
                [4 ]Center for Advanced Life Cycle Engineering (CACE), University of Maryland, College Park , MD 20740, USA
                [5 ]Global Energy Quality And Reliability Technology (G.E.Q.A.R.T). PTE.LTD, Sims Residence , 8 Lorong, 29 Geylang #06-12, Singapore 387882, Singapore
                Author notes
                Article
                srep12967
                10.1038/srep12967
                4526891
                26692268
                98e3972b-4050-42a3-a0a5-e076ff90ff7a
                Copyright © 2015, Macmillan Publishers Limited

                This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

                History
                : 25 February 2015
                : 07 July 2015
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