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      Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor

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      Journal of Applied Physics
      AIP Publishing

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          Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

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            A nonoptical tip–sample distance control method for near‐field scanning optical microscopy using impedance changes in an electromechanical system

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              A phase-locked shear-force microscope for distance regulation in near-field optical microscopy

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                August 1997
                August 1997
                : 82
                : 3
                : 980-984
                Article
                10.1063/1.365936
                95fe82e1-df2b-4a5c-bc35-0f1d930303a4
                © 1997
                History

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