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      Microscopic structure of theSiO2/Si interface

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          Journal
          PRBMDO
          Physical Review B
          Phys. Rev. B
          American Physical Society (APS)
          0163-1829
          September 1988
          September 1988
          : 38
          : 9
          : 6084-6096
          Article
          10.1103/PhysRevB.38.6084
          9947067
          9266ea98-4fc9-43a4-9409-903b15cbf515
          © 1988

          http://link.aps.org/licenses/aps-default-license

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