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      Towards high density STT-MRAM at sub-20nm nodes

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      Author(s): , , , , , , , , , ,
      Publication date (Print):
      Publisher: IEEE
      Conference name: 2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)
      Conference date: May 16, 2018 - May 19, 2018

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          Conference
          Publisher: IEEE
          Publication date: April 2018
          Publication date (Print): April 2018
          Pages: 1-2
          Article
          DOI: 10.1109/VLSI-TSA.2018.8403867
          SO-VID: 8ef4b9ca-8956-4332-b461-5ba69a5bfc56
          Copyright © © 2018
          Conference name: 2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)
          Conference location: Hsinchu, Taiwan
          Conference date: May 16, 2018 - May 19, 2018
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