Author(s):
V. D. Nguyen ,
N. Perrissin ,
S. Lequeux ,
J. Chatterjee ,
L. Tille ,
S. Auffret ,
R. Sousa ,
E. Gautier ,
L. Vila ,
L. Prejbeanu ,
B. Dieny
Publication date (Print):
April 2018
Conference name: 2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)
Conference date: May 16, 2018 - May 19, 2018