Decentralized Monitoring of Dynamic Processes Based on Dynamic Feature Selection and Informative Fault Pattern Dissimilarity

Tong, Chudong; Shi, Xuhua

doi:10.1109/TIE.2016.2530047

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Decentralized Monitoring of Dynamic Processes Based on Dynamic Feature Selection and Informative Fault Pattern Dissimilarity

Author(s): Chudong Tong , Xuhua Shi

Publication date (Print): June 2016

Journal: IEEE Transactions on Industrial Electronics

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

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Title: IEEE Transactions on Industrial Electronics

Abbreviated Title: IEEE Trans. Ind. Electron.

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

ISSN (Print): 0278-0046

ISSN (Electronic): 1557-9948

Publication date Created: June 2016

Publication date (Print): June 2016

Volume: 63

Issue: 6

Pages: 3804-3814

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DOI: 10.1109/TIE.2016.2530047

SO-VID: 781e17f9-947b-4176-86a9-e3b1053aef13

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Decentralized Monitoring of Dynamic Processes Based on Dynamic Feature Selection and Informative Fault Pattern Dissimilarity

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