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      Securing Facial Bioinformation by Eliminating Adversarial Perturbations

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          Deep Residual Learning for Image Recognition

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            Densely Connected Convolutional Networks

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              Xception: Deep Learning with Depthwise Separable Convolutions

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                Author and article information

                Contributors
                Journal
                IEEE Transactions on Industrial Informatics
                IEEE Trans. Ind. Inf.
                Institute of Electrical and Electronics Engineers (IEEE)
                1551-3203
                1941-0050
                May 2023
                May 2023
                : 19
                : 5
                : 6682-6691
                Affiliations
                [1 ]Nanchang University, Nanchang, China
                [2 ]School of Software, Nanchang University, Nanchang, China
                [3 ]Hangzhou Dianzi University, Hangzhou, China
                [4 ]Graduate School of Science and Engineering, Hosei University, Tokyo, Japan
                [5 ]Department of Math and Computer Science, Brandon University, Brandon, MB, Canada
                [6 ]Department of Institute of Intelligent Systems, University of Johannesburg, Johannesburg, South Africa
                [7 ]Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, Shenzhen, China
                Article
                10.1109/TII.2022.3201572
                71e52a9b-d5b4-47a0-af2c-b45afbe5500a
                © 2023

                https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html

                https://doi.org/10.15223/policy-029

                https://doi.org/10.15223/policy-037

                History

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