Use of Raman scattering to investigate disorder and crystallite formation in as-deposited and annealed carbon films

Dillon, R. O.; Woollam, John A.; Katkanant, V.

doi:10.1103/PhysRevB.29.3482

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Use of Raman scattering to investigate disorder and crystallite formation in as-deposited and annealed carbon films

Author(s): R. O. Dillon , John A. Woollam , V. Katkanant

Publication date (Print): March 1984

Journal: Physical Review B

Publisher: American Physical Society (APS)

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Journal ID (publisher-id): PRBMDO

Title: Physical Review B

Abbreviated Title: Phys. Rev. B

Publisher: American Physical Society (APS)

ISSN (Print): 0163-1829

Publication date Created: March 1984

Publication date (Print): March 1984

Volume: 29

Issue: 6

Pages: 3482-3489

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DOI: 10.1103/PhysRevB.29.3482

SO-VID: 6bc6880d-6f21-41d8-8f05-3f71935f2172

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Use of Raman scattering to investigate disorder and crystallite formation in as-deposited and annealed carbon films

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Photoluminescent Nanomaterials

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