6
views
0
recommends
+1 Recommend
0 collections
    0
    shares
      • Record: found
      • Abstract: not found
      • Article: not found

      Indirect band gap of coherently strained\({\mathrm{Ge}}_{\mathrm{x}}\)\({\mathrm{Si}}_{1\mathrm{-}\mathrm{x}}\)bulk alloys on〈001〉silicon substrates

      Physical Review B
      American Physical Society (APS)

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references14

          • Record: found
          • Abstract: not found
          • Article: not found

          Transport and Deformation-Potential Theory for Many-Valley Semiconductors with Anisotropic Scattering

            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            GexSi1−x/Si strained‐layer superlattice grown by molecular beam epitaxy

              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              Cyclotron Resonance Experiments in Uniaxially Stressed Silicon: Valence Band Inverse Mass Parameters and Deformation Potentials

                Bookmark

                Author and article information

                Journal
                PRBMDO
                Physical Review B
                Phys. Rev. B
                American Physical Society (APS)
                0163-1829
                July 1985
                July 1985
                : 32
                : 2
                : 1405-1408
                Article
                10.1103/PhysRevB.32.1405
                6aaca175-3bf3-4636-b015-267544dc9878
                © 1985

                http://link.aps.org/licenses/aps-default-license

                History

                Comments

                Comment on this article