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      Dielectric Constant of Silicon Dioxide Deposited by Atmospheric-Pressure Chemical Vapor Deposition Using Tetraethylorthosilicate and Ozone

      Japanese Journal of Applied Physics
      Japan Society of Applied Physics

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          Journal
          JAPNDE
          Japanese Journal of Applied Physics
          Jpn. J. Appl. Phys.
          Japan Society of Applied Physics
          0021-4922
          1347-4065
          March 15 1994
          March 15 1994
          : 33
          : Part 1, No. 3A
          : 1385-1389
          Article
          10.1143/JJAP.33.1385
          6598ca1f-997a-4045-ad78-afcb9a6340cc
          © 1994
          History

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