Crystallinity of PTCDA films on silicon derived via optical spectroscopic measurements

Salvan, G; Himcinschi, C.; Kobitski, A.Yu.; Friedrich, M.; Wagner, H.P.; Kampen, T.U.; Zahn, D.R.T.

doi:10.1016/S0169-4332(01)00069-1

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Crystallinity of PTCDA films on silicon derived via optical spectroscopic measurements

Author(s): G Salvan , C Himcinschi , A.Yu Kobitski , M Friedrich , H.P Wagner , T.U Kampen , D.R.T Zahn

Publication date Created: May 2001

Publication date (Print): May 2001

Journal: Applied Surface Science

Publisher: Elsevier BV

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Title: Applied Surface Science

Abbreviated Title: Applied Surface Science

Publisher: Elsevier BV

ISSN (Print): 01694332

Publication date Created: May 2001

Publication date (Print): May 2001

Volume: 175-176

Pages: 363-368

Article

DOI: 10.1016/S0169-4332(01)00069-1

SO-VID: 6162e85e-f4a9-4635-ac74-f9034f27b8a5

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https://www.elsevier.com/tdm/userlicense/1.0/

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Crystallinity of PTCDA films on silicon derived via optical spectroscopic measurements

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