6
views
0
recommends
+1 Recommend
0 collections
    0
    shares
      • Record: found
      • Abstract: not found
      • Article: not found

      Accurate recovery of three-dimensional shape from image focus

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references8

          • Record: found
          • Abstract: found
          • Article: not found

          A new sense for depth of field.

          This paper examines a novel source of depth information: focal gradients resulting from the limited depth of field inherent in most optical systems. Previously, autofocus schemes have used depth of field to measured depth by searching for the lens setting that gives the best focus, repeating this search separately for each image point. This search is unnecessary, for there is a smooth gradient of focus as a function of depth. By measuring the amount of defocus, therefore, we can estimate depth simultaneously at all points, using only one or two images. It is proved that this source of information can be used to make reliable depth maps of useful accuracy with relatively minimal computation. Experiments with realistic imagery show that measurement of these optical gradients can provide depth information roughly comparable to stereo disparity or motion parallax, while avoiding image-to-image matching problems.
            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            Focusing

              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              Focusing techniques

                Bookmark

                Author and article information

                Journal
                IEEE Transactions on Pattern Analysis and Machine Intelligence
                IEEE Trans. Pattern Anal. Machine Intell.
                Institute of Electrical and Electronics Engineers (IEEE)
                01628828
                March 1995
                : 17
                : 3
                : 266-274
                Article
                10.1109/34.368191
                60bbd89c-efbf-4123-8a77-bf29bd8e0561
                © 1995
                History

                Comments

                Comment on this article

                scite_
                0
                0
                0
                0
                Smart Citations
                0
                0
                0
                0
                Citing PublicationsSupportingMentioningContrasting
                View Citations

                See how this article has been cited at scite.ai

                scite shows how a scientific paper has been cited by providing the context of the citation, a classification describing whether it supports, mentions, or contrasts the cited claim, and a label indicating in which section the citation was made.

                Similar content1,475

                Cited by12

                Most referenced authors29