The Structural and Electrical Properties of the Au/n-Si (MS) Diodes With Nanocomposites Interlayer (Ag-Doped ZnO/PVP) by Using the Simple Ultrasound-Assisted Method

Alt, S.; Sevgili, O.; Azizian-Kalandaragh, Y.

doi:10.1109/TED.2019.2913906

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The Structural and Electrical Properties of the Au/n-Si (MS) Diodes With Nanocomposites Interlayer (Ag-Doped ZnO/PVP) by Using the Simple Ultrasound-Assisted Method

Author(s): S. Alt , O. Sevgili , Y. Azizian-Kalandaragh

Publication date (Print): 2019

Journal: IEEE Transactions on Electron Devices

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

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Title: IEEE Transactions on Electron Devices

Abbreviated Title: IEEE Trans. Electron Devices

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

ISSN (Print): 0018-9383

ISSN (Electronic): 1557-9646

Publication date (Print): 2019

Pages: 1-7

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DOI: 10.1109/TED.2019.2913906

SO-VID: 588f8cd6-1cb8-4e77-9369-44b1f73ef429

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The Structural and Electrical Properties of the Au/n-Si (MS) Diodes With Nanocomposites Interlayer (Ag-Doped ZnO/PVP) by Using the Simple Ultrasound-Assisted Method

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