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      EEG-Rhythm Specific Taylor–Fourier Filter Bank Implemented With O-Splines for the Detection of Epilepsy Using EEG Signals

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          Deep Convolutional Neural Networks for Computer-Aided Detection: CNN Architectures, Dataset Characteristics and Transfer Learning

          Remarkable progress has been made in image recognition, primarily due to the availability of large-scale annotated datasets and deep convolutional neural networks (CNNs). CNNs enable learning data-driven, highly representative, hierarchical image features from sufficient training data. However, obtaining datasets as comprehensively annotated as ImageNet in the medical imaging domain remains a challenge. There are currently three major techniques that successfully employ CNNs to medical image classification: training the CNN from scratch, using off-the-shelf pre-trained CNN features, and conducting unsupervised CNN pre-training with supervised fine-tuning. Another effective method is transfer learning, i.e., fine-tuning CNN models pre-trained from natural image dataset to medical image tasks. In this paper, we exploit three important, but previously understudied factors of employing deep convolutional neural networks to computer-aided detection problems. We first explore and evaluate different CNN architectures. The studied models contain 5 thousand to 160 million parameters, and vary in numbers of layers. We then evaluate the influence of dataset scale and spatial image context on performance. Finally, we examine when and why transfer learning from pre-trained ImageNet (via fine-tuning) can be useful. We study two specific computer-aided detection (CADe) problems, namely thoraco-abdominal lymph node (LN) detection and interstitial lung disease (ILD) classification. We achieve the state-of-the-art performance on the mediastinal LN detection, and report the first five-fold cross-validation classification results on predicting axial CT slices with ILD categories. Our extensive empirical evaluation, CNN model analysis and valuable insights can be extended to the design of high performance CAD systems for other medical imaging tasks.
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            Indications of nonlinear deterministic and finite-dimensional structures in time series of brain electrical activity: Dependence on recording region and brain state

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              Extreme learning machine for regression and multiclass classification.

              Due to the simplicity of their implementations, least square support vector machine (LS-SVM) and proximal support vector machine (PSVM) have been widely used in binary classification applications. The conventional LS-SVM and PSVM cannot be used in regression and multiclass classification applications directly, although variants of LS-SVM and PSVM have been proposed to handle such cases. This paper shows that both LS-SVM and PSVM can be simplified further and a unified learning framework of LS-SVM, PSVM, and other regularization algorithms referred to extreme learning machine (ELM) can be built. ELM works for the "generalized" single-hidden-layer feedforward networks (SLFNs), but the hidden layer (or called feature mapping) in ELM need not be tuned. Such SLFNs include but are not limited to SVM, polynomial network, and the conventional feedforward neural networks. This paper shows the following: 1) ELM provides a unified learning platform with a widespread type of feature mappings and can be applied in regression and multiclass classification applications directly; 2) from the optimization method point of view, ELM has milder optimization constraints compared to LS-SVM and PSVM; 3) in theory, compared to ELM, LS-SVM and PSVM achieve suboptimal solutions and require higher computational complexity; and 4) in theory, ELM can approximate any target continuous function and classify any disjoint regions. As verified by the simulation results, ELM tends to have better scalability and achieve similar (for regression and binary class cases) or much better (for multiclass cases) generalization performance at much faster learning speed (up to thousands times) than traditional SVM and LS-SVM.
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                Author and article information

                Contributors
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                Journal
                IEEE Sensors Journal
                IEEE Sensors J.
                Institute of Electrical and Electronics Engineers (IEEE)
                1530-437X
                1558-1748
                2379-9153
                June 15 2020
                June 15 2020
                : 20
                : 12
                : 6542-6551
                Article
                10.1109/JSEN.2020.2976519
                55a0d67a-b099-4da4-98dc-a7726a07619a
                © 2020

                https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html

                https://doi.org/10.15223/policy-029

                https://doi.org/10.15223/policy-037

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