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      New infrared detector on a silicon chip

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          Semiconductor Physics

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            Pseudomorphic growth of GexSi1−xon silicon by molecular beam epitaxy

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              Silicon MBE apparatus for uniform high‐rate deposition on standard format wafers

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                Author and article information

                Journal
                IEEE Transactions on Electron Devices
                IEEE Trans. Electron Devices
                Institute of Electrical and Electronics Engineers (IEEE)
                0018-9383
                September 1984
                September 1984
                : 31
                : 9
                : 1135-1139
                Article
                10.1109/T-ED.1984.21676
                540a3620-f319-4d95-9bfc-5e29ea811b51
                © 1984
                History

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