Inviting an author to review:
Find an author and click ‘Invite to review selected article’ near their name.
Search for authorsSearch for similar articles
90
views
0
recommends
+1 Recommend
0 collections
    0
    shares
      • Record: found
      • Abstract: not found
      • Article: not found

      A New Convolutional Neural Network-Based Data-Driven Fault Diagnosis Method

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references30

          • Record: found
          • Abstract: found
          • Article: found
          Is Open Access

          Deep Learning in Neural Networks: An Overview

          (2014)
          In recent years, deep artificial neural networks (including recurrent ones) have won numerous contests in pattern recognition and machine learning. This historical survey compactly summarises relevant work, much of it from the previous millennium. Shallow and deep learners are distinguished by the depth of their credit assignment paths, which are chains of possibly learnable, causal links between actions and effects. I review deep supervised learning (also recapitulating the history of backpropagation), unsupervised learning, reinforcement learning & evolutionary computation, and indirect search for short programs encoding deep and large networks.
            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            A Survey of Fault Diagnosis and Fault-Tolerant Techniques—Part I: Fault Diagnosis With Model-Based and Signal-Based Approaches

              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              Deep neural networks: A promising tool for fault characteristic mining and intelligent diagnosis of rotating machinery with massive data

                Bookmark

                Author and article information

                Journal
                IEEE Transactions on Industrial Electronics
                IEEE Trans. Ind. Electron.
                Institute of Electrical and Electronics Engineers (IEEE)
                0278-0046
                1557-9948
                July 2018
                July 2018
                : 65
                : 7
                : 5990-5998
                Article
                10.1109/TIE.2017.2774777
                4f49c22f-8fd6-4efb-9478-f67a39e8509e
                © 2018
                History

                Comments

                Comment on this article