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      Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research

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          Surface Studies by Scanning Tunneling Microscopy

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            Surface-enhanced Raman spectroscopy.

            The ability to control the size, shape, and material of a surface has reinvigorated the field of surface-enhanced Raman spectroscopy (SERS). Because excitation of the localized surface plasmon resonance of a nanostructured surface or nanoparticle lies at the heart of SERS, the ability to reliably control the surface characteristics has taken SERS from an interesting surface phenomenon to a rapidly developing analytical tool. This article first explains many fundamental features of SERS and then describes the use of nanosphere lithography for the fabrication of highly reproducible and robust SERS substrates. In particular, we review metal film over nanosphere surfaces as excellent candidates for several experiments that were once impossible with more primitive SERS substrates (e.g., metal island films). The article also describes progress in applying SERS to the detection of chemical warfare agents and several biological molecules.
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              Principles of Nano-Optics

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                Author and article information

                Contributors
                (View ORCID Profile)
                Journal
                Advanced Materials
                Adv. Mater.
                Wiley
                0935-9648
                1521-4095
                June 2019
                April 2019
                June 2019
                : 31
                : 24
                : 1804774
                Affiliations
                [1 ]Department of Physics and Astronomy Stony Brook University Stony Brook NY 11794 USA
                [2 ]Division of Nanophotonics CAS Center for Excellence in Nanoscience National Center for Nanoscience and Technology Beijing 100190 China
                [3 ]Shanghai Key Lab of Modern Optical Systems and Engineering Research Center of Optical Instrument and System Ministry of Education University of Shanghai for Science and Technology Shanghai 200093 China
                [4 ]Department of Physics Columbia University New York NY 10027 USA
                Article
                10.1002/adma.201804774
                30932221
                4a95e9a2-18ba-4adf-88c1-3b4114c47f1a
                © 2019

                http://onlinelibrary.wiley.com/termsAndConditions#am

                http://onlinelibrary.wiley.com/termsAndConditions#vor

                http://doi.wiley.com/10.1002/tdm_license_1.1

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