Surface Profiling by Analysis of White-light Interferograms in the Spatial Frequency Domain

An optical evaluation technique is described that is suitable for determining the positions and magnitudes of reflection sites within miniature optical assemblies. This method utilizes the coherence effects exhibited by a broadband optical source and is referred to as optical coherence-domain reflectometry. Background theory is given, and experimental results have demonstrated a resolution of 10 microm with an optical dynamic range of more than 100 dB.

With a multimode semiconductor laser we have been able to measure the optical length of the eye within a precision of 0.03 mm. A first series of in vivo measurements acoustically determined eye length.