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      Large-Signal Reliability Analysis of SiGe HBT Cascode Driver Amplifiers

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          Journal
          Title: IEEE Transactions on Electron Devices
          Abbreviated Title: IEEE Trans. Electron Devices
          Publisher: Institute of Electrical and Electronics Engineers (IEEE)
          ISSN (Print): 0018-9383
          ISSN (Electronic): 1557-9646
          Publication date Created: May 2015
          Publication date (Print): May 2015
          Volume: 62
          Issue: 5
          Pages: 1383-1389
          Article
          DOI: 10.1109/TED.2015.2407870
          SO-VID: 4186220a-5a9b-4699-bf33-e4c20e9d6abd
          Copyright © © 2015
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