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      Addendum: “Looking 100 Å deep into spatially inhomogeneous dilute systems with hard X-ray photoemission” [Appl. Phys. Lett. 85, 4532 (2004)]

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          High resolution-high energy x-ray photoelectron spectroscopy using third-generation synchrotron radiation source, and its application to Si-high k insulator systems

          T Hattori, H Nohira, S. Shin … (2003)
          Article 0 comments Cited 68 times – based on 0 reviews     Review now
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            Looking 100 Å deep into spatially inhomogeneous dilute systems with hard x-ray photoemission

            B Cowie, G. Paolicelli, J. Zegenhagen … (2004)
            Article 0 comments Cited 15 times – based on 0 reviews     Review now
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              Author and article information

              Journal
              Journal ID (publisher-id): APPLAB
              Title: Applied Physics Letters
              Abbreviated Title: Appl. Phys. Lett.
              Publisher: AIP Publishing
              ISSN (Print): 0003-6951
              ISSN (Electronic): 1077-3118
              Publication date Created: July 18 2005
              Publication date (Print): July 18 2005
              Publication date (Electronic): July 12 2005
              Volume: 87
              Issue: 3
              Page: 039901
              Affiliations
              [1 ]INFM—Dipartimento di Fisica, Politecnico di Milano, piazza L. da Vinci 32, 20133 Milano, Italy
              [2 ]Laboratory TASC INFM, Area Science Park, S.S. 14 Km 163.5, 34012 Basovizza, Trieste, Italy
              [3 ]INFM—Università Roma III, via della Vasca Navale 84, 00146 Roma, Italy
              [4 ]European Synchrotron Radiation Facility, B.P. 220, 38043 Grenoble Cédex, France
              Article
              DOI: 10.1063/1.1996837
              SO-VID: 2871c5d5-d7c1-4b3b-a920-9e391a62c8e0
              Copyright © © 2005
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