A Model for Mark Size Dependence on Field Emission Voltage in Heat-Assisted Magnetic Probe Recording on CoNi/Pt Multilayers

Onoue, T; Zhu, J-G; Abelmann, L.; Zhang, L.; Bain, J.A.

doi:10.1109/TMAG.2004.830220

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A Model for Mark Size Dependence on Field Emission Voltage in Heat-Assisted Magnetic Probe Recording on CoNi/Pt Multilayers

Author(s): L. Zhang , J.A. Bain , J.-G. Zhu , L. Abelmann , T. Onoue

Publication date Created: July 2004

Publication date (Print): July 2004

Journal: IEEE Transactions on Magnetics

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

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Generalized Formula for the Electric Tunnel Effect between Similar Electrodes Separated by a Thin Insulating Film

John G. Simmons (1963)

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Surface Studies by Scanning Tunneling Microscopy

G. Binnig, H Rohrer, Andreas Gerber … (1982)

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7 × 7 Reconstruction on Si(111) Resolved in Real Space

G. Binnig, H Rohrer, Ch. Gerber … (1983)

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Title: IEEE Transactions on Magnetics

Abbreviated Title: IEEE Trans. Magn.

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

ISSN (Print): 0018-9464

Publication date Created: July 2004

Publication date (Print): July 2004

Volume: 40

Issue: 4

Pages: 2549-2551

Article

DOI: 10.1109/TMAG.2004.830220

SO-VID: 1a796b69-e6d9-4772-9ffa-c4b59a42600f

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A Model for Mark Size Dependence on Field Emission Voltage in Heat-Assisted Magnetic Probe Recording on CoNi/Pt Multilayers

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Most cited references 12

Generalized Formula for the Electric Tunnel Effect between Similar Electrodes Separated by a Thin Insulating Film

Surface Studies by Scanning Tunneling Microscopy

7 × 7 Reconstruction on Si(111) Resolved in Real Space

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