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Bias‐stress‐induced stretched‐exponential time dependence of charge injection and trapping in amorphous thin‐film transistors
Author(s):
F. R. Libsch
,
J. Kanicki
Publication date
Created:
March 15 1993
Publication date
(Print):
March 15 1993
Journal:
Applied Physics Letters
Publisher:
AIP Publishing
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Exponential Random Graph Models
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Hopping exponential band tails.
(1985)
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Theory of trap-controlled transient photoconduction
Fred Schmidlin
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Defect pool in amorphous-silicon thin-film transistors
W. I. Milne
,
S. C. Deane
,
A. R. Franklin
…
(1992)
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Author and article information
Journal
Title:
Applied Physics Letters
Abbreviated Title:
Appl. Phys. Lett.
Publisher:
AIP Publishing
ISSN (Print):
0003-6951
ISSN (Electronic):
1077-3118
Publication date Created:
March 15 1993
Publication date (Print):
March 15 1993
Volume
: 62
Issue
: 11
Pages
: 1286-1288
Article
DOI:
10.1063/1.108709
SO-VID:
0eab1c99-eb82-46b4-9645-c8a8d411e807
Copyright ©
© 1993
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